Abstract:
This paper examines the effect of new technology trends such as less power consumption and smaller chip feature size on very large scale integration devices. The conventional way of detecting soft error is to save one parity bit with each message word and by checking the parity bit at the output we can detect the soft error. But in proposed method, an approach is provided which can be applied on previously saved data and afterwards error can be detected. In this method 64 bit data is saved in a VLSI chip and then 8 bit parity sequence of this data is generated. After sometimes due to some transient changes like alpha particles from package decay, cosmic rays emission and thermal neutrons, error may be generated in that saved data of 64 bit. The proposed method can be used to detect a single bit soft error from the saved data by using the parity detection method.

Keywords:Neutron, cosmic rays, parity bit and soft error